Fischer worldwide – Slovenia

English

 
X-Ray Fluorescence:
Most effective method for
multi-layer and alloy systems

The XDLM® instruments with micro focus tube and proportional counter tube are ideally suited for the inspection of parts where small structures are measured. Typical applications are measurements on pc-boards, plug contacts and electronic components and also the inspection of thin coatings.

XDLM® instruments are equipped with four exchangeable apertures and a programmable XY(Z) measuring stage. This makes them also ideally suited for testing mass-produced parts.

 
Certification / Accreditation|SiteMap|Measurement Requirements