The XDAL® instruments with silicon PIN detectors provide reliable analysis results and coating thickness readings even with small concentrations and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements.

Typical areas of application are:

• Analysis of very thin coatings, e.g. gold and palladium coatings of ≤ 0.1 μm
• Measurement of functional coatings in the electronics and semiconductor industries
• Determination of complex multi-coating systems
• Automated measurements, e.g. in quality control
• Determination of the lead content in solder